ANM
2010
3rd
International Conference on Advanced Nano Materials
12-15 September 2010 - Agadir, Morocco
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Abstract
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ANMM283 |
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20 NM THICK INCUBATION-FREE P-TYPE NANOCRYSTALLINE
SILICON THIN FILMS GROWN IN PRESENCE OF TRIMETHYLBORON BY RF-PECVD
TECHNIQUE FOR SOLAR CELL APPLICATIONS |
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S.A. Filonovich, H. Águas,
A. Vicente, A. Araujo, I. Bernacka-Wojcik, M. Vilarigues, E. Fortunato,
R. Martins |
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CENIMAT/I3N, Departamento de Ciência dos
Materiais, FCT-UNL, 2829-516 Caparica, Portugal
Departamento de Conservação e Restauro, FCT-UNL, 2829-516
Caparica, Portugal |
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In
this work we investigate the influence of deposition parameters on the
optical, structural and electronic properties of p-type nanocrystalline
Si (nc-Si:H) thin films using trimethylboron (TMB) as a dopant gas. The
obtained films were characterized by Spectroscopic Ellipsometry, Raman
Spectroscopy, electrical conductivity measurements and applied in
amorphous and nanocrystalline solar cells (SCs) as a window layer.
Using relatively high gas pressure (3 Torr), high hydrogen dilution
(98%) and low deposition temperature (150ºC) we achieved dark
conductivity, σd, values of 9 S/cm for a thin film with the
thickness of 200 nm. Modelling of spectroscopic ellipsometry data
indicates that the growth of nanocrystalline films occurs by a
sub-surface incubation layer mechanism, instead of the typical
incubation layer at the interface substrate – film.
Special attention was paid to deposition of very thin (~20 nm) p-type
nc-Si:H films. The σd value remains high, i.e. more than 1 S/cm,
in a wide range of the film thicknesses – from 27 to 212 nm.
However, a decrease in thickness from 27 to 22 nm, leads to a drop of
σd more than two orders of magnitude. In this work we also
investigate the origin of such behavior, and propose a way for
improvement of the electronic properties by exposure of the
film’s surface to the hydrogen plasma. Application of short term
(3 minutes) hydrogen plasma treatment modifies both surface and
sub-surface layers, and leads to an increase of the σd up to 10
times. However, longer hydrogen plasma treatment can be detrimental.
P-type nc-Si:H layers were used as a window layers in amorphous and
nanocrystalline SCs, and preliminary results of non-optimized SCs
exhibit low series resistance and efficiency about 6%. A further
improvement of the SC operation is expected upon optimization of the SC
configuration, e.g. inclusion of buffer layer, light trapping
techniques, etc.
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