ANM
2010
3rd
International Conference on Advanced Nano Materials
12-15 September 2010 - Agadir, Morocco
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Abstract
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ANMM169 |
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NONRESONANT DETECTION OF TERAHERTZ RADIATION IN
HIGH-ELECTRON-MOBILITY TRANSISTOR STRUCTURE USING InAlAs/InGaAs/InP
MATERIAL SYSTEMS AT ROOM TEMPERATURE |
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Amine El Moutaouakil (1), Tetsuya Suemitsu (1), Taiichi Otsuji (1), Dominique Coquillat (2), Wojciech Knap (2) |
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(1) Research Institute of Electrical Communication (RIEC), Tohoku University
(2) Groupe d’Etude des Semiconducteurs GES-CNRS, Monpellier 2 University |
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Terahertz
(THz) technology gained a huge interest in the recent years, due to its
potential applications in security, materials identification,
communication, and imaging. High-electron-mobility transistors (HEMTs)
based on InAlAs/InGaAs/InP material systems have successfully
demonstrated better emission properties of THz radiation over
InGaP/InGaAs/GaAs HEMTs, making them a better candidate as THz
emitters, due to their smaller size and higher quality factor.
In this paper, we report on nonresonant detection of THz radiation
using a HEMT device based on the similar structure at room temperature.
The experiments were performed using a Gunn diode operating at 300 GHz
as the THz source. The measured responsivity showed reasonable coupling
and polarization dependence to the THz radiation, taking the highest
value when the incident THz radiation is linearly polarized to the
source-drain direction. Compared to the traditional HEMTs, the
responsivity of this device was relatively higher than 230 V/W, which
is due to the higher electron sheet density in the channel and the good
lattice matching, resulting in a better quality factor. The noise
equivalent power (NEP) was also measured and it had a lower value of
~10^(-11) W/Hz^(0.5), which is well comparable to Microbolometers
operating at 4K. Obtained performances are also well comparable to, or
even higher than, those for other HEMTs and other THz detectors at room
temperature (Golay cells, Shottky diodes and Pyroelectric detectors).
In summary, we successfully confirmed a highly sensitive nonresonant
THz detection in our InAlAs/InGaAs/InP HEMT at room temperature. The
measured responsivity and NEP exhibited higher values, promoting the
device as the smallest and most effective THz detector.
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