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   ANM 2010
    3rd International Conference on Advanced Nano Materials
    12-15 September 2010 - Agadir, Morocco

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   Abstract


ANMM109
 MAGNETIC PROPERTIES OF X/T-METAL/X; X=(FE,NI) MULTILAYERS
A. Zolanvari, H. Sadeghi, R. Pourmoosavi and J. Nezamdost
Department of Physics University of Arak, P. O. Box: 38156-879, Arak, Iran
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In this paper, the nanostructure and magnetic properties of Ni/Cu multilayers has been studied.  The nanostructures of the crystalline phase are correlated with crystallographic preferential orientation. The (111) and (200) preferentially oriented Ni films contain fiber textured microstructures, which have been revealed by pole figure x-ray diffraction (XRD) measurements in Crystalline and magnetic properties were measured by x-ray diffraction (XRD), magnetic force microscopy (MFM) and alternative gradient force magnetometery (AGFM) analysis. Pole figure(PF) measurements at a diffracted position were also performed to determine the average disorientation angles of subgrains. Texture formation in thin films directly influences the physical characteristics of materials such as magnetic, mechanical and electrical properties.
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